Refractive Index & k

Filmetrics Applications (Thickness Measurement) – Refractive Index & k

Filmetrics systems measure refractive index and extinction coefficient over wavelengths as wide as 200-1700 nm - in seconds and with a single mouse click.  In many cases Filmetrics accuracy is even better than much more complicated and expensive ellipsometry methods, especially when the film is absorbing and on a transparent substrate, which is often the case for Si3N4, ITO, and many other common materials.

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