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Material Characterization - Quantitative Adhesion Testing 4 Point Bend
Material Characterization - Integrated Metrology Annealing Chamber
Electrical Measurement Techniques - fully automated product wafer monitor for oxide quality and gate oxide stack evaluation.
Electrical Measurement Techniques - Metal Contamination Testing on Production Wafers
Electrical Measurement Techniques - Sheet Resistance and Leakage Current Mapping Tool
Optical Measurement Techniques - Wafer Thickness
Optical Measurement Techniques - Film Stress
Optical Measurements Techniques - Imaging Low Coherence Interferometry
The Filmetrics F10-RT reflectometer captures reflectance and transmittance spectra with a single mouse-click.
The Filmetrics® F60-c family maps film thickness and index just like our F50 products, but it also includes a number of features intended specifically for production environments.
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