The F54 of Filmetrics has arrived, and it will be sent to the customer after undergoing strict inspection.

Thin-film thickness on samples up to 200mm by 200mm is easily mapped with the F54-XY-200 advanced spectral reflectance system. The motorized X-Y stage moves automatically to specified measurement locations, facilitating thickness measurements as quickly as two points per second.

Choose one of the dozens of predefined polar, rectangular, or linear map patterns, or create your own with no limit on the number of measurement points on our automated film thickness mapping system.

The table-top instrument connects to the USB port of your Windows® computer, can be set up in minutes and can be used by anyone with basic computer skills.

The different models are distinguished primarily by thickness and wavelength range. Generally, shorter wavelengths (e.g. F54-XY-200-UV) are required for measurement of thinner films, while longer wavelengths allow measurement of thicker, rougher, and more opaque films.

Model Specifications