Frontier Semiconductor, Inc (FSM) was founded in 1988. It currently offers a range of advanced metrology products for semiconductor application, including Measurement Systems for Film Stress Material Characterization for new films, Thermal Desorption Spectroscopy, Quantitative Electrical Characterization systems for Sheet Resistance and Leakage Current Measurements for USJ and Metal Contamination, diffusion length measurements for patterned wafers. Systems are supported globally by FSM sales, service team and local / regional partners, Premier Solutions in Asia.