Film thickness is measured in-line quickly and easily with the affordable F32. Spectral analysis of reflectance from the top and bottom of your film provides thickness information in real time.

The F32 advanced-spectrometry system comes in a half-width 3U rack-mount chassis and, with additional spectrometers, can measure up to four different locations (up to two locations for -EXR and -UVX versions). The F32 software can be controlled through digital I/O or the host software to start/stop/reset measurements. Measurement data can be exported automatically to the host software for statistical process control (SPC). Filmetrics^® also provides optional lens assemblies for easy integration onto existing production fixtures.

The included software and USB connectivity make installing the F32 onto any Windows-platform PC simple. With help from the FILMeasure software, which is preloaded with over one-hundred materials, measurements of single and multilayer stacks are easily attainable. New materials can be added quickly by measuring the optical constants of samples or by importing data from an existing source.

Model Specifications

Model	Thickness Range*	Wavelength Range
F32	15nm - 70µm	380-1050nm
F32-EXR	15nm - 250µm	380-1700nm
F32-NIR	100nm - 250µm	950-1700nm
F32-UV	1nm - 40µm	190-1100nm
F32-UVX	1nm - 250µm	190-1700nm
F32-XT	0.2µm - 450µm	1440-1690nm
F32-sX Series	10µm- 3mm	960-1580nm
*film stack dependent