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F32 Series

F32 Series

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F32 Series

The Compact Solution for In-line Measurements
Film thickness is measured in-line quickly and easily with the affordable F32. Spectral analysis of reflectance from the top and bottom of your film provides thickness information in real time.

The F32 advanced-spectrometry system comes in a half-width 3U rack-mount chassis and, with additional spectrometers, can measure up to four different locations (up to two locations for -EXR and -UVX versions). The F32 software can be controlled through digital I/O or the host software to start/stop/reset measurements. Measurement data can be exported automatically to the host software for statistical process control (SPC). Filmetrics® also provides optional lens assemblies for easy integration onto existing production fixtures.

The included software and USB connectivity make installing the F32 onto any Windows-platform PC simple. With help from the FILMeasure software, which is preloaded with over one-hundred materials, measurements of single and multilayer stacks are easily attainable. New materials can be added quickly by measuring the optical constants of samples or by importing data from an existing source.

Model Specifications

Model Thickness Range* Wavelength Range
F32 15nm - 70µm 380-1050nm
F32-EXR 15nm - 250µm 380-1700nm
F32-NIR 100nm - 250µm 950-1700nm
F32-UV 1nm - 40µm 190-1100nm
F32-UVX 1nm - 250µm 190-1700nm
F32-XT 0.2µm - 450µm 1440-1690nm
F32-sX Series 10µm- 3mm 960-1580nm
*film stack dependent

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