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Filmetrics
Filmetrics
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Filmetrics is the world’s sales leader in thin-film thickness measurement, with the mission of making thin-film measurements simple and affordable.

Filmetrics measure thin-film thickness by analyzing how light is reflected by the film. By analyzing wavelengths beyond those visible to the human eye Filmetrics can measure nearly all non-metallic films greater than 100 atoms thick.  And because there are no moving parts, results are available in seconds: film thickness, refractive index, even roughness!

Filmetrics  Equipment

Filmetrics was founded in 1995 with the mission of making thin-film measurements simple
and affordable. Prior to their arrival, film-thickness measurement instruments cost $50,000 or more, requiring advanced training and single measurements took as long as an hour. Filmetrics devices are easy-to-use, cost less and take less than a second to produce results in film-thickness measurements, by operators who can be trained in minutes. Furthermore, you can count on their team for immediate 24-hour support via online meetings and embedded diagnostics. It is a proven system with a substantial track record by research institutions and industries.

Single-Spot Thickness Measurements

Tabletop systems for measuring film thickness and refractive index with a single mouse-click. Measure thickness from 1nm – 10mm – even within multilayer film stacks.

  • F20
  • F3-sX
  • F10-ARc
  • F10-HC
  • F3-CS
  • F10-AR
  • F10-RT
filmetrics f20
F40 System

‍Microscopic-Spot Thickness Measurements

Used when a measurement spot as small as 1µm is required – use your own microscope or let us supply the entire system.

  • F40 System

Sheet Resistance Measurement

Filmetrics R-Series sheet resistance mapping tools marry the technology developed and perfected by KLA for over 45 years with the benchtop instrument technology developed over the last 20 years by the Filmetrics team. The R50-4PP contact four-point probe is recommended for thin metal and ion implant layers, and the R50-EC non-contact eddy current probe is recommended for thicker metal layers and soft or flexible surfaces, including:

  • Semiconductor wafer substrates
  • Glass substrates
  • Plastic (flexible) substrates
  • PCB patterned features
  • Solar Cells
  • Flat panel display layers and patterned features
  • Metal foils
Filmetrics R50 Series
Filmetrics The-Profilm3D

The World’s First Affordable 3D Profilometer: The Profilm3D

Get an optical profilometer for less than half the price of an AFM or 3D stylus profilometer!

The Profilm3D® uses state-of-the-art white light interferometry (WLI) to measure surface profiles and roughness down to 0.05µm; adding the low-cost PSI option takes the minimum vertical feature size down to 0.001µm. The newest generation of the Profilm3D offers Enhanced Roughness Mode for accurately imaging rough surfaces and highly-sloped sidewalls.

‍Inline Thickness Monitoring

Monitor and control thickness of moving films during production. Sample rates as high as 100Hz are possible at multiple measurement locations.

Filmetrics F30 ‍Inline Thickness Monitoring

‍Automated Thickness Mapping Systems

‍Automated Thickness Mapping Systems

Fully-automatic mapping of thickness and index for nearly any sample shape

  • F50 System
  • F54
  • F54-XY-200
  • F60-C System
  • F60-t System

Recommend


 

R50 Series

R50 Series

Filmetrics R-Series sheet resistance mapping tools marry the technology developed and perfected by KLA for over 45 years 

The World’s First Affordable 3D Profilometer: The Profilm3D

The World’s First Affordable 3D Profilometer: The Profilm3D

The Profilm3D® uses state-of-the-art white light interferometry (WLI) to measure surface profiles and roughness down to 0.05µm

F40 System

F40 System

Filmetrics - Attaches to your microscope to measure spot as small as 1µm or let us supply the entire system.

 
F20 Series

F20 Series

Filmetrics – The World’s best-selling tabletop thin film thickness measurement system.  Available with a wide range of accessories and thickness coverage.

F3-sX

F3-sX

The F3-sX family measures semiconductor and dielectric layers up to 3 mm thick. Such thick layers tend to be rougher and less uniform than thinner layers

F10-ARc

F10-ARc

Now it’s easy to measure curved surfaces including anti-reflection coatings on eyeglasses and other optical lenses.

F3-CS

F3-CS

Filmetrics® designed the F3-CS specifically for measurement of small witness or coupon samples.

F10-HC System

F10-HC System

Filmetrics - Measures hardcoat and anti fog film thickness and index.  Popular in automotive and other industries that hardcoat polycarbonate.

F10-RT System

F10-RT System

The Filmetrics F10-RT reflectometer captures reflectance and transmittance spectra with a single mouse-click.

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