The F3-sX family measures semiconductor and dielectric layers up to 3 mm thick. Such thick layers tend to be rougher and less uniform than thinner layers, which the F3-sX counters with a 10-µm-diameter measurement spot. With it the F3-sX family easily measures materials that are impossible to measure with other instruments.

Now it’s easy to measure curved surfaces including anti-reflection coatings on eyeglasses and other optical lenses.

Filmetrics - Measures reflectance and transmittance simultaneously.  Options available for thin film measurement / thickness and index measurement